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JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**

JOURNEY TO DATA QUALITY (THE MIT PRESS) By Yang W. Lee & Leo L. Pipino **Mint**

USD 21.49 USD
SKU: sRO2pMvG
GTIN: 9780262513357
Condition: Like New
Tags: 0.5 in 0262513358 11 Oz 2009 240 Pages 6.3 in 8.9 in 9780262513357 Computers English Journey to Data Quality MIT Press Quality Press Textbook Trade Paperback
Categories: Textbooks, Education & Reference

Specifications

ISBN-100262513358
GenreCOMPUTERS
ISBN9780262513357
Publication NameJourney to Data Quality
PublisherMIT Press
Item Length8.9 in
Publication Year2009
TypeTextbook
FormatTrade Paperback
LanguageEnglish
Item Height0.5 in
Item Weight11 Oz
Item Width6.3 in
Number Of Pages240 Pages

This textbook is the one I used for my final year project research.

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